Intern - DRAM R&D Product Engineering

Project Title: DRAM Performance Improvement

Descriptions: DRAM yield, quality and throughput performance improvement through Electrical Failure Analysis (EFA) and data analysis, using knowledge of DRAM circuits, operations and electrical testing methodology.

Scope

• Debug, identify root causes, and develop solutions for failures through Electrical Failure Analysis (EFA) and data analysis.
• Monitor yields and verify that yields meet projections.
• Prioritize and identify opportunities for efficiency and technical improvements.
• Develop AI enhancements for EFA and data analysis work.

Supporting Teams

All relevant engineering teams onsite

Deliverables

• Debug and identify root causes of failures.
• Develop solutions for failures through Electrical Failure Analysis (EFA) and data analysis.

Stretch Goals

• Monitor yields and ensure they meet projections.
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